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Highly effective AFM Offline Evaluation Software program Now Out there for Oxford Devices Asylum Analysis Jupiter XR Massive-Pattern Atomic Drive Microscope

Oxford Devices Asylum Analysis right now broadcasts the discharge of AR Maps, a brand new and highly effective knowledge evaluation software program bundle for the Jupiter XR atomic pressure microscope (AFM). AR Maps offers roughness data primarily based on ISO requirements, generate statistics stories, conduct crucial dimension and trench evaluation, carry out particle evaluation, and way more. The brand new AR Maps software program bundle will ship with all new Jupiter XR AFM programs and will likely be obtainable as an improve for current prospects.

“The Jupiter XR has turn out to be the go-to analysis AFM for industrial functions with its x5-x20 quicker scanning functionality vs conventional AFMs, high-resolution imaging efficiency that improves accuracy and precision, and our unique blueDrive tapping mode expertise that enhances measurement stability and repeatability,” mentioned Dr. Ben Ohler, Senior Product Line Supervisor at Oxford Devices Asylum Analysis. “Asylum Analysis is dedicated to strengthen effectivity on the Jupiter AFM, so along with the Superior Automation software program bundle launched a couple of months in the past, we are actually providing AR Maps to offer sturdy offline evaluation capabilities.

Capabilities of AR Maps will likely be proven at an Asylum Analysis webinar “Finest Practices for Vital Dimension Measurements utilizing AFM: Probe Choice and Information Evaluation” scheduled for Could 15th at 8 am and 6 pm PDT. To register for this occasion, please go to

AR Maps Software program for Jupiter XR AFM

AR Maps Software program for Jupiter XR AFM. Video Credit score: Asylum Analysis – An Oxford Devices Firm




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